CIF Past Schools & Courses
Fall 2017 -Xray Diffraction and Scattering Methods for Materials Analysis
Are you interested in expanding your knowledge on how X-ray diffraction or scattering can be used to analyze different types of materials? The CIF is hosting a Materials Analysis Short Course on September 14-15 during which you can learn and gain hands-on experience with different experimental approaches used in X-ray diffraction/scattering techniques.
A basic understanding of X-ray diffraction and scattering is required in order to be able to follow the lectures and data interpretation covered by application scientists from CSU, Bruker, PANalytical, and Malvern. Take advantage of a unique opportunity offered by Bruker to have your samples analyzed for more advanced analysis prior to the workshop.
Summer 2016 -Advanced Applications of NMR Spectroscopy and Mass Spectrometry
Are you interested in expanding your knowledge on how NMR or Mass Spectrometry can be used to solve problems in chemical, life or materials sciences? The 3rd Annual CIF Summer School is your opportunity to learn and gain hands-on experience with different experimental approaches used in NMR and MS. The school addresses CSU graduate students, postdocs and scientists who focus on molecular structure and dynamics characterization, but welcomes anyone with a keen interest in NMR and MS. A basic understanding of MS and NMR is required in order to be able to follow the lectures.
- Week 1: NMR and MS Basics and Biological Applications.
- Fundamentals of NMR and MS
- MS ionization techniques
- NMR and MS-based metabolomics
- HRMAS, solid-state NMR, high-res NMR
- Week 2: Structural Elucidation and Advanced Topics.
- NMR- and MS-based structural elucidation (2D NMR, tandem-MS)
- Quantitative NMR and MS
- Advanced topics (Diffusion NMR, kinetics, polymers, isotope labeling)
Summer 2015 – Electron Diffraction Methods for Materials Analysis
The 2015 CIF Summer School consisted of a 3-day workshop meant to introduce participants to different electron diffraction methods for micro-structuralcrystallographic characterization of materials in scanning and transmission electron microscopy.
- Day 1: Conventional diffraction meodes in TEM (SAED, NBD, CBED)
- Day 2: Precession electron diffraction and crystallography
- Day 3: Electron backscatter diffraction in SEM
The school was open to both CSU and non-CSU students, researchers and professionals in the field.
Sponsors included JEOL, NanoMEGAS, EDAX and Gatan.
Summer 2014- Electron Microscopy & Materials Analysis
The 2014 CIF Summer School consisted of two 5-day, 1-credit courses, with subjects in applied materials analysis, including surface characterization, thin film, crystal, powder and solid X-ray, spectroscopic and microscopic analyses:
- Session 1 (CHEM 651B): Electron Microscopy: May 19-23, 2014
- Session 2 (CHEM 651A): Materials Analysis: June 2-6, 2014
Students obtained practical understanding of which instrumental methods to use for characterizing different types of materials, and how to derive morphological, structural and compositional information at different scales.
Sponsors included JEOL USA Inc, Topspin and PANalytical.
- Cooperative learning of individual techniques through lecture & laboratory instruction.
- Discussion of sample handling, sample preparation, etc. for different techniques and sample types.
- Exposure and hands-on experience with new state-of-the art instrumentation and technology used routinely in materials analysis, including X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), profilometry, contact angle, high resolution scanning electron microscopy (SEM) and transmission electron microscopy (TEM) imaging, energy dispersive X-ray spectroscopy (EDS), precession electron diffraction (PED), tomography and electron backscatter diffraction (EBSD).
- Application highlights keynote lectures by prominent research scientists in the field.
- ‘PICO’ presentations (2-slides/2-minutes) by course participants about EM and materials analysis applications in their research.