Dr. Roy Geiss

Roy Geiss

Research Scientist I

Analytical Specialist TEM/SEM

CIF, Yates 101
970-491-6103 | Roy.Geiss@Colostate.edu

Ph.D. in Applied Physics,  Cornell University, Ithaca NY.
B.S. in Physics, Lafayette College, Easton PA.


Roy received his Ph.D. in Applied Physics from Cornell University under Prof. John Silcox. He did a post-doc at the University of Virginia and served 20 years as a Research Scientist at IBM Research Division, San Jose, CA. Most recently, Roy worked as Materials Research Engineer at NIST, Boulder, CO. His research is on a wide variety of hard and soft materials using both transmission electron microscopy (TEM) and scanning electron microscopy (SEM) and associated techniques such as EDS, electron diffraction and image analysis and simulations.