Imaging and Surface Science Laboratory
The Imaging and Surface Science laboratory has several tools for examining materials and can provide high resolution (angstrom to micron scale), detailed pictures of surfaces and thin films, micro-structural crystallographic information (from electron diffraction data), and X-ray spectral data including elemental analysis of small features.
All of our instruments are open-access to CSU students and researchers, after having received training by CIF staff. Please register as a new user to schedule training, and reserve instrument time by using the online calendars. Use of the TEM requires more assistance due to the complexity of the instrument.
Electron microscopy instruments
JEOL JSM-6500F field emission scanning electron microscope (FESEM) equipped with the In-Lens thermal field emission electro gun (TFEG). This high resolution tool has a multi-purpose specimen chamber and a motorized, automated stage. The SEM is equipped with a Thermo Electron energy dispersive X-ray spectrometer (EDS) for qualitative and quantitative elemental analysis, and with a Nabity e-beam lithography patterning system (NPGS). The NPGS in conjunction with our FESEM allows for patterns to be written with our SEM that are just a few tens of nanometers in width.
JEOL JEM-2100F transmission electron microscope (TEM) with HR pole piece, STEM and electron diffraction cameras for studying both hard and soft materials with atomic scale resolution. Also available is a Fishione model 1070 nanoclean plasma cleaner for TEM sample prep.
Surface Analysis Instruments
- Manuals and Instructional Tools / Aids:
- PE-5800 X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA) – a technique to investigate the chemical composition of surfaces (elemental identity, chemical state, and quantity of elements). Can also provide useful information about depth profile and thickness (<10 nm) of thin films. Some key features of the XPS in our facility include:
- Accurate quantitative chemical state analysis of surfaces
- Superior thin film characterization (sputter depth profiling)
- Superior angle dependent analysis (non-destructive depth profiling)
- Effortless analysis of electrically insulating samples
- Scanning Auger Microscopy (SAM) with submicron spatial resolution
- Dual beam charge neutralization technology provides “hands off” charge neutralization on electrically insulating samples
- Bruker Dektak XT Stylus Profilometer for measuring a material surface’s profile and quantifying its roughness.
- Nanoscience 2 AFM with both continuous and tapping mode tips, nanometer or better resolution possible
- Krüss DSA10 Drop Shape Analysis System Contact Angle Goniometer (CAG) used to measuring contact angles using the sessile drop technique. The DSA10 is capable of measuring static contact angles (still camera mode) or time dependent contact angles (video camera mode) on flat substrates using a wide variety of probe liquids.