JEOL JSM-6500F Scanning Electron Microscope

CIF SEM JEOL-JSM 6500F

JEOL-JSM 6500F

Analytical Capabilities

(under development)

Electron Diffraction Capabilities in SEM

(under development)

Sample requirements and preparation

(under development)

SEM image of MoS2 nanowire

SEM image of MoS2 nanowire (overlaid with gold)


 

Training and Services

 
 

SEM image of MoS2 nanowire

Image taken with JSM-6500F SEM by Erin Stuckert (graduate student of Dr. Ellen Fisher).


 

Resources and useful links

Microscopy Society of America
JEOL SEM