X-ray Diffraction Laboratory

The X-ray Diffraction laboratory has tools for studying surface layers or thin film structures, single crystals, powders, and solids. Information about crystallites, absolute stereochemistry, domain sizes, defects, surface thickness and roughness, and chemical composition may be obtained. Instruments can do X-ray photoelectron spectroscopy, X-ray diffraction, X-ray reflection and X-ray scattering.

Available instruments
  • PE-5800 X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA) – a technique to investigate the chemical composition of surfaces (elemental identity, chemical state, and quantity of elements). Can also provide useful information about depth profile and thickness (<10 nm) of thin films. Some key features of the XPS in our facility include:
    • Accurate quantitative chemical state analysis of surfaces
    • Superior thin film characterization (sputter depth profiling)
    • Superior angle dependent analysis (non-destructive depth profiling)
    • Effortless analysis of electrically insulating samples
    • Scanning Auger Microscopy (SAM) with submicron spatial resolution
    • Dual beam charge neutralization technology provides “hands off” charge neutralization on electrically insulating samples
  • Bruker D8 Discover DaVinci Powder X-ray Diffractometer (PXRD) – Precise and non-destructive X-ray analysis that affords ualitative and quantitative phase analysis, and characterization of various properties such as particle size, strain, and stress of polycrystalline samples. Key features include:
    • CuKα radiation
    • LYNXEYE-XE-T energy discriminating detector
    • Nine position sample changer with Phi rotation
    • Electrochemical cell for in situ experiments
  • Bruker D8 Discover Series II X-ray Diffractometer (PXRD) – Precise and non-destructive X-ray analysis that affords qualitative and quantitative phase analysis, and characterization of various properties such as particle size, strain, and stress of polycrystalline samples. Key features include:
    • CuKα radiation
    • LYNXEYE Energy Discriminating Detector
    • HTK-1200N temperature stage w/ capillary extension
  • Bruker D8 Discover Series I X-ray Diffractometer – Precise and non-destructive X-ray diffraction analysis of thin films and multi-layered structures. Key features include:
    • Parabolic Göbel mirror for parallel and monochromatic beam
    • ¼-circle Eulerian cradle
    • Measurement types include:
      • X-ray Reflectivity (XRR) – determination of thickness, density, or roughness of thin films and multilayers
      • Glancing Angle X-ray Diffraction (GAXRD) – low incident angles maximize the signal from thin layers as well as offering depth profiling of the phase composition of layers
      • Residual Stress and Texture Analysis of thin films
  • Bruker APEXII single-crystal diffraction system (SCXRD) – Non-destructive technique that provides precise information about 3-D molecular and crystal structures of small molecule single-crystals. Key features include:
    • MoKα radiation (Optional CuKα source available upon request)
    • Provides detailed information about the internal lattice of crystalline substances  unit cell dimensions, bond lengths, bond angles, and details of site-ordering
  • Rigaku Wide Angle X-ray Scattering (WAXS)/Small Angle X-ray Scattering (SAXS) – For determining shape and size of macromolecules and characterization of block co-polymers. Key features include:
    • Cu rotating anode
    • 2D multi-wire detector
    • Characteristic distances of partially ordered materials, pore sizes, and other data
    • Structural information of macromolecules between 5 and 25 nm of repeat distances in partially ordered systems up to 150 nm

Location and Contact

CIF X-ray Diffraction Laboratory
CSU main campus
Chemistry B115 (X-ray lab) and C03 (XPS)
Dr. Brian Newell (XRD)                    Dr. Patrick McCurdy (XPS)
Phone: (970) 491-6209                      Phone: (970) 491-1876
Email: Brian.Newell@colostate.edu          Email:Patrick.McCurdy@colostate.edu

 

 

 

 

 

 

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