CIF Short Course-Fall 2017

Registration is now open!

 September 14-15, 2017

Xray Diffraction and Scattering Methods for Materials Analysis

Are you interested in expanding your knowledge on how X-ray diffraction or scattering can be used to analyze different types of materials? The CIF is hosting a Materials Analysis Short Course on September 14-15 during which you can learn and gain hands-on experience with different experimental approaches used in X-ray diffraction/scattering techniques.

A basic understanding of X-ray diffraction and scattering is required in order to be able to follow the lectures and data interpretation covered by application scientists from CSU, Bruker, PANalytical, and Malvern. Take advantage of a unique opportunity offered by Bruker to have your samples analyzed for more advanced analysis prior to the workshop.

CIF Summer School 2017-flyer JPEG

Day 1:  XRD for structural analysis
Day 2:  SAXS and DLS for particle size distributions and molecular weight estimations

Cost:  CSU participants: $100/day
External: $500/day

Please stay tuned for updates on workshop details and registration.


Registration is now open!

Event Schedule

Contact Information

For more information, please contact: